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MM912F634CV2AP Datasheet(PDF) 37 Page - Freescale Semiconductor, Inc |
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MM912F634CV2AP Datasheet(HTML) 37 Page - Freescale Semiconductor, Inc |
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37 / 335 page  Electrical Characteristics ESD Protection and Latch-up Immunity MM912F634 Freescale Semiconductor 37 3.8 ESD Protection and Latch-up Immunity All ESD testing is in conformity with CDF-AEC-Q100 stress test qualification for automotive grade integrated circuits. During the device qualification, ESD stresses were performed for the Human Body Model (HBM), Machine Model (MM), Charge Device Model (CDM), as well as LIN transceiver specific specifications. A device will be defined as a failure if after exposure to ESD pulses, the device no longer meets the device specification. Complete DC parametric and functional testing is performed per the applicable device specification at room temperature, followed by hot temperature, unless specified otherwise in the device specification. Table 46. ESD and Latch-up Protection Characteristics Ratings Symbol Value Unit ESD - Human Body Model (HBM) following AEC-Q100 / JESD22-A114 (CZAP = 100 pF, RZAP = 1500 Ω) - LIN (DGND, PGND, AGND, and LGND shorted) - VS1, VS2, VSENSE, Lx - HSx - All other Pins VHBM ±8000 ±4000 ±3000 ±2000 V ESD - Charged Device Model (CDM) following AEC-Q100, Corner Pins (1, 12, 13, 24, 25, 36, 37, and 48) All other Pins VCDM ±750 ±500 V ESD - Machine Model (MM) following AEC-Q100 (CZAP = 200 pF, RZAP =0 Ω), All Pins VMM ±200 V Latch-up current at TA = 125 °C(47) ILAT ±100 mA ESD GUN - LIN Conformance Test Specification(49), unpowered, contact discharge, CZAP= 150 pF, RZAP = 330 Ω. - LIN (with or without bus filter CBUS=220 pF) - VS1, VS2 with CVS - Lx with serial RLX ±15000 ±20000 ±6000 V ESD GUN - IEC 61000-4-2 Test Specification(50), unpowered, contact discharge, CZAP= 150 pF, RZAP = 330 Ω - LIN (with or without bus filter CBUS=220 pF) - VSENSE with serial RVSENSE(48) - VS1, VS2 with CVS - Lx with serial RLX ±8000 ±8000 ±8000 ±8000 V ESD GUN - ISO10605 Test Specification(50), unpowered, contact discharge, CZAP= 150 pF, RZAP =2.0 kΩ - LIN (with or without bus filter CBUS=220pF) - VSENSE with serial RVSENSE(48) - VS1, VS2 with CVS - Lx with serial RLX ±6000 ±6000 ±6000 ±6000 V ESD GUN - ISO10605 Test Specification(50), powered, contact discharge, CZAP= 330 pF, RZAP =2.0 kΩ - LIN (with or without bus filter CBUS=220 pF) - VSENSE with serial RVSENSE(48) - VS1, VS2 with CVS - Lx with serial RLX ±8000 ±8000 ±8000 ±8000 V Note: 47. Input Voltage Limit = -2.5 to 7.5 V. 48. With CVBAT (10…100 nF) as part of the battery path. 49. Certification available on request 50. Tested internally only; certification pending |
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