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BQ76PL455APFCT Datasheet(PDF) 31 Page - Texas Instruments

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Part # BQ76PL455APFCT
Description  16-Cell Industrial Integrated Battery Monitor
PDF  125 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

BQ76PL455APFCT Datasheet(HTML) 31 Page - Texas Instruments

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bq76PL455A
www.ti.com
SLUSCL0A – SEPTEMBER 2016 – REVISED OCTOBER 2016
Product Folder Links: bq76PL455A
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Copyright © 2016, Texas Instruments Incorporated
7.3.11 Register and EEPROM
7.3.11.1 Error Check and Correct (ECC) EEPROM
Register values for selected registers are permanently stored in EEPROM. All registers also exist as volatile
storage locations at the same addresses, referred to as shadow registers. The volatile registers are for reading,
writing, and device control. For a list of registers included in the EEPROM, see Table 7.
At wakeup, the bq76PL455A first loads all shadow registers with default values from Register Summary. Then
the bq76PL455A loads the registers conditionally with EEPROM contents from the results of the Error Check and
Correct (ECC) evaluation of the EEPROM.
The EEPROM is loaded to shadow registers in 64-bit blocks; each block has its own Error Check and Correct
(ECC) value stored. The ECC detects a single bit (Single-Error-Correction) or double bit (Double-Error-Detection)
changes in EEPROM stored data.
The ECC is calculated for each block, individually. Single-bit errors are corrected, double-bit errors are only
detected, not corrected. A block with good ECC is loaded. A block with a single-bit error is corrected, and either
FAULT_DEV[USER_ECC_COR] or FAULT_DEV[FACT_ECC_COR] bit is set to flag the corrected error event.
The block is loaded to shadow registers after the single-bit error correction. Since the evaluation is on a block-by-
block basis, it is possible for multiple blocks to have a single-correctable error per block and still be loaded
correctly. Multiple bit errors can exist with full correction, as long as they are limited to a single error per block.
A
block
with
a
bad
ECC
comparison
(two
bit
errors
in
one
block)
is
not
loaded
and
the
FAULT_DEV[USER_ECC_ERR] or FAULT_DEV[FACT_ECC_ERR] bit is set to flag the failed bit-error event.
The default value remains in the register. This allows some blocks to be loaded correctly (no fail or single bit
corrected value) and some blocks not to load. Any time either of the FAULT_DEV[*_ECC_ERR] is set, and the
condition is not cleared by a soft reset, the device has failed and should not be used.
7.3.12 FAULT Sensing and Signaling
A dedicated differential FAULT link allows each bq76PL455A in a stack of devices to signal the presence of any
monitored and active/latched fault condition to the main microcontroller separately from the UART link. The
FAULTH+/– and
FAULTL+/– pins
implement
an
AC-coupled
differential-signaling
scheme
similar
to
communication pins COMML+/– and COMMH+/–, but using only a simple heartbeat signal to indicate normal or
fault conditions by the presence or absence of a repetitive pulse, respectively. The low duty-cycle heartbeat
stops anytime it senses a fault and the fault condition sets a bit in one of the FAULT_* registers. Masked faults
have no effect on the heartbeat generation.



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