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BQ76PL455APFCT Datasheet(PDF) 42 Page - Texas Instruments |
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BQ76PL455APFCT Datasheet(HTML) 42 Page - Texas Instruments |
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42 / 125 page  ~100 Ÿ AFE LVL SHIFT + ± + ± WINDOW COMP ~100 Ÿ ~100 Ÿ ~100 Ÿ AFE LVL SHIFT + ± + ± WINDOW COMP VSENSEn VSENSEn-1 ~100 Ÿ AFE LVL SHIFT + ± + ± WINDOW COMP ~100 Ÿ VSENSEn+1 ~5k ~5 N Ÿ SQUEEZE SQUEEZE 100 Ÿ 1 µF 100 Ÿ 1 µF 100 Ÿ 1 µF LOW PASS FILTER Copyright © 2016, Texas Instruments Incorporated 42 bq76PL455A SLUSCL0A – SEPTEMBER 2016 – REVISED OCTOBER 2016 www.ti.com Product Folder Links: bq76PL455A Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Figure 24. Window Comparator Input Configuration Overview 7.3.12.9 Communications Faults During the course of normal data communications, noise may induce errors in the bit stream. The errors may assert faults depending on the mask settings in the MASK_COMM and MASK_SYS registers. • UART communications faults details are in UART Interface to Host Microcontroller • Differential (VBUS) communications faults description is a part of the protocol description in Protocol Description |
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