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BQ76PL455APFCT Datasheet(PDF) 10 Page - Texas Instruments |
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BQ76PL455APFCT Datasheet(HTML) 10 Page - Texas Instruments |
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10 / 125 page ![]() 10 bq76PL455A SLUSCL0A – SEPTEMBER 2016 – REVISED OCTOBER 2016 www.ti.com Product Folder Links: bq76PL455A Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated 6.11 ADC: VSENSEn Cell Measurement Inputs PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VCELL_VR Input voltage range VCELL= VSENSEn – VSENSEn–1, n= 1 to 16 1 4.95 V VCHERR25NB Total Channel Measurement Accuracy at 25°C VSENSE = 3.6 V ±0.75 mV VCHERR Total Channel Measurment Accuracy, temperature range of 0°C to 65°C (1)(2) VSENSE = 1.5 V –1.50 1.50 mV VSENSE = 2.0 V –2.00 2.00 VSENSE = 3.3 V –3.25 3.25 VSENSE = 3.6 V –3.50 3.50 VSENSE = 4.2 V –3.90 3.90 VSENSE = 4.5 V –4.00 4.00 VCHERR Total Channel Measurment Accuracy, temperature range of –40°C to 85°C (1)(2) VSENSE = 1.5 V –2.85 2.85 mV VSENSE = 2.0 V –3.00 3.00 VSENSE = 3.3 V –4.75 4.75 VSENSE = 3.6 V –5.00 5.00 VSENSE = 4.2 V –5.50 5.50 VSENSE = 4.5 V –5.75 5.75 ISENSE_SEL (3)(4) VSENSEn input current n = 1 to 16 VSENSEn–1 pin; on selected channel 2 7.6 µA ISENSE_NSEL Channel not selected < ±100 nA ISENSE_SD VSENSEn input current in SHUTDOWN Mode < ±100 nA RSENSE_SEL (4) VSENSE input resistance Channel selected for conversion, measured differentially [VSENSEn–VSENSE(n–1)] 1 MΩ OWDSR Open-wire detection shunt resistance Open-wire test mode, TSTCONFIG[4] = 1 all odd (CBENBL = 0xAA); or all even (CBENBL=0x55) cell squeeze resistors on (alternate resistors only) 4 kΩ LT_DriftVCHAN Long-term drift (total channel path) VSENSE = 4.5 V, TA = 65°C (5) 18.47 ppm/ 1000 hours VSENSE = 4.5 V, TA = 105°C (6) 50.24 VADC_REF_25 ADC reference 2.5 V ERRADC_REF_25 ADC reference error 0°C ≤ TA ≤ 65°C –2.5 2.5 mV –40°C ≤ TA ≤ 85°C –3.5 3.5 mV (1) Error measured with averaging enabled. (2) User adjustable Gain and Offset registers are provided for further error trim at VSGAIN and VSOFFSET, respectively. (3) When the bq76PL455A is in IDLE power mode, but not converting any ADC input channel, the part idles the multiplexer on the highest channel enabled for conversions in the CHAN register. (4) The current into VSENSEn = ISENSE_SEL + VCELL/RSENSE_SEL. (5) Computed from the first 500-hour operating life test at a stress temperature of 65°C. (6) Computed from the first 500-hour operating life test at a stress temperature of 105°C. 6.12 ADC: VMODULE Input PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VMODULE_VR Input voltage range Measured from TOP to GND (AGND1) VTOP MIN VTOP MAX V VMODULE_ERR85 Total error from all internal sources TA = –40°C to 85°C –450 ±100 450 mV (1) Specified by design, not tested in production. (2) Calculated and statistically projected worst case from characterization data. Not tested in production. 6.13 ADC: AUXn General Purpose Inputs PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VAUX_VR Input voltage range(1) VP/VDIG = 5.3 V 0 5 V VAUXERR65 Total AUX Channel Measurement Accuracy(2) VAUX = 0.05 V, 0°C ≤ TA ≤ 65°C –3 0.1 3 mV VAUX = 4.95 V, 0°C ≤ TA ≤ 65°C –10 0.1 10 mV VAUXERR85 Total AUX Channel Measurement Accuracy(2) VAUX = 0.05 V, –40°C ≤ TA ≤ 85°C –4.5 0.1 4.5 mV VAUX = 4.95 V, –40°C ≤ TA ≤ 85°C –12.5 0.1 12.5 mV |
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