BQ76PL455APFCT datasheet(41/125 Pages) TI1

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bq76PL455A

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SLUSCL0A – SEPTEMBER 2016 – REVISED OCTOBER 2016

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CAUTION

Using the Squeeze function under open wire conditions and with a broken connection

to the external Zener may cause internal device damage to occur.

It is highly recommended to run all diagnostic tests on the bq76PL455A after correction of the open wire

condition. Pay special attention to the validation of the window comparator accuracy against the AFE accuracy to

ensure parametric compliance. In the event of non-compliance, remove the affected bq76PL455A device from

service immediately.

In the example in Figure 24, the Squeeze resistor is enabled for (across) VSENSEn-1 to VSENSEn. This will

cause the apparent voltage seen by the comparators for cell n–1 and cell n+1 to increase. For the cell voltage of

cell n, which in this example is approximately 3.6 V, there will be an additional drop on the internal lines going to

the window-comparator block (but not to the AFE) of (3.6 V / 5K × 100 × 2) = approximately 144 mV. This will

also show up as an increase of approximately 72 mV on the cells above and below the cell being squeezed.

Larger input resistors, such as 1 kΩ, will dominate this error source and may result in unexpected trips of the

window comparators, depending on the threshold settings, and will change the manner in which the calculations

suggested in this example are made.

BQ76PL455APFCT Datasheet(PDF) 41 Page - Texas Instruments