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BQ76PL455APFCT Datasheet(PDF) 84 Page - Texas Instruments |
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BQ76PL455APFCT Datasheet(HTML) 84 Page - Texas Instruments |
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84 / 125 page  84 bq76PL455A SLUSCL0A – SEPTEMBER 2016 – REVISED OCTOBER 2016 www.ti.com Product Folder Links: bq76PL455A Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated 7.6.3.34 FAULT_SYS 0x60 (96) System Fault BIT NAME DESCRIPTION [7] SYS_RESET Write '1': Reset the bit to zero. Write '0': No effect Read '1': A system reset has been detected. [6] COMM_TIMEOUT Write '1': Reset the fault condition. Write '0': No effect Read '1': Communications timeout has been detected. [5] VDIG_WAKE_FAULT Write '1': Reset the fault condition. Write '0': No effect Read '1': VDIG supply was already high on wakeup. This could happen if the NPN transistor were leaking and preventing VDIG from going away when VP/VDIG shuts down. It could also occur if the chip is reset (in which case the VDIG supply remained on) or if it was shut down too briefly to allow the supply time to ramp down. This bit is provided to allow detection of leakage current into the supply during shutdown. This bit is checked only set by the device during the device initialization sequence. Once cleared, it will not set again until the block is reset. [4] INT_TEMP_FAULT Write '1': Reset the fault condition. Write '0': No effect Read '1': Overtemperature condition in the digital die If UNLATCHED_FAULT is set, this bit is self-clearing. [3] VDIG_FAULT Write '1': Reset the fault condition. Write '0': No effect Read '1': VDIG supply failure detected in the analog die. [2] VM_FAULT Write '1': Reset the fault condition. Write '0': No effect Read '1': VM supply failure detected in analog die. [1] VP_FAULT Write '1': Reset the fault condition. Write '0': No effect Read '1': VP supply failure detected in analog die. [0] VP_CLAMP Write '1': Reset the fault condition. Write '0': No effect Read '1': NPNB pin is monitored and clamped to keep the NPNB pin from going over voltage. 7.6.3.35 FAULT_DEV 0x61–62 (97–98) Chip Fault BIT NAME DESCRIPTION [15] USER_CKSUM_ERR Write '1': No effect Write '0': No effect Read '1': A checksum error was detected in the registers. This fault is self-clearing when the condition goes away. [14] FACT_CKSUM_ERR Write '1': Reset the fault condition. Write '0': No effect Read '1': A checksum error was detected in the factory registers. [13] ANALOG_FAULT_ERR Write '1': Reset the fault condition. Write '0': No effect Read '1': The analog die is reporting an error, but it cannot tell what the error is (no error condition has been detected). This may be caused by a single event upset, or possibly the device has failed. If this occurs consistently, the device should be removed from service. [12] HREF_FAULT Write '1': Reset the fault condition. Write '0': No effect Read '1': Analog die 4.5-V reference measurement was out of range. |
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