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BQ76PL455APFCT Datasheet(PDF) 33 Page - Texas Instruments

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Part # BQ76PL455APFCT
Description  16-Cell Industrial Integrated Battery Monitor
PDF  125 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

BQ76PL455APFCT Datasheet(HTML) 33 Page - Texas Instruments

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FAULT _2UV[]
FAULT _UV[]
These UV and OV window comparator (WINCOMP) faults
only clear automatically when UNLATCHED _FAULT is set
and NO OTHER analog die based fault exists. This is true
even for faults that are masked.
Analog die faults include FAULT_SYS[3:0] or any bit in
registers FAULT _2UV[] or FAULT _2OV[].
CELL0_OV[]
FAULT _UV[]
CELL_UV[]
CELLn ADC RESULT [15 :0]
UV_FAULT _ANY
≥1
UV_FAULT [15:0]
FAULT MASKING
FAULT SOURCES
FAULT STATUS
UV_THRESH_CELL[15:0 ]
OV_THRESH_CELL[15: 0]
P < Q
P
Q
P > Q
P
Q
CELLn_UV_FAULT
OV_FAULT[15:0]
CELLn_OV_FAULT
OV_FAULT _ANY
≥1
16
16
UNLATCHED_FAULT
COMP_UV[]
VSENSEn
COMP_UV_FAULT _ANY
≥1
COMP_UV_THRESH[7:1]
FAULT MASKING
FAULT SOURCES
COMP_OV_FAULT _ANY
≥1
16
COMP_OV[]
COMP_OV_THRESH[7:1]
VSENSEn-1
UV COMP
DAC
REF2
OV COMP
DAC
REF2
FAULT STATUS
COMP_UV_FAULT[15:0]
FAULT _2OV[]
COMP_OV_FAULT [15:0]
&
NCHAN[]
V_CELL < COMP_UV_THRESH
V_CELL > COMP_OV_THRESH
COMP_CONFIG < 1
&
NCHAN[]
COMP_CONFIG < 2
VSENSEn
VSENSEn-1
≥1
SYSFLT_ANL_ANY
&
16
16
ADC
NCHAN []
UNLATCHED_FAULT
NCHAN []
UNLATCHED_FAULT
33
bq76PL455A
www.ti.com
SLUSCL0A – SEPTEMBER 2016 – REVISED OCTOBER 2016
Product Folder Links: bq76PL455A
Submit Documentation Feedback
Copyright © 2016, Texas Instruments Incorporated
Figure 20. Analog Faults



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