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BQ76PL455APFCT Datasheet(PDF) 40 Page - Texas Instruments |
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BQ76PL455APFCT Datasheet(HTML) 40 Page - Texas Instruments |
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40 / 125 page ![]() 40 bq76PL455A SLUSCL0A – SEPTEMBER 2016 – REVISED OCTOBER 2016 www.ti.com Product Folder Links: bq76PL455A Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated FAULT_AUX[AUX_UV_FAULT, AUX_OV_FAULT] will be continually set based on the currently stored ADC result and threshold. This allows testing of the threshold and fault by changing the threshold without having to sample the channel. Example: The design requires AUX0 and AUX1 undervoltage threshold at 1 V and AUX0 and AUX1 overvoltage threshold at 3 V. The design requires that no FAULT pin activation result from AUX UV or OV conditions on AUX2…AUX7. Set the following conditions: AUX0_UV = 1 V, AUX0_OV = 3 V AUX1_UV = 1 V, AUX1_OV = 3 V AUX2_UV = 0 V, AUX2_OV = 5 V AUX3_UV = 0 V, AUX3_OV = 5 V AUX4_UV = 0 V, AUX4_OV = 5 V AUX5_UV = 0 V, AUX5_OV = 5 V AUX6_UV = 0 V, AUX6_OV = 5 V AUX7_UV = 0 V, AUX7_OV = 5 V 7.3.12.8 Secondary Protectors: Analog Window Comparators for Cell UV/OV Thirty-two analog comparators, connected in pairs as window comparators for the 16 channels, provide cell- voltage monitoring that is separate from the main acquisition path and work in parallel with the main ADC route. Configuration of the faults sensed by the analog window comparators is by the number of channels enabled in the NCHAN register. In case of malfunction of the AFE or ADC, the analog comparators will still be able to flag the crossing of the (register selectable) undervoltage and overvoltage comparator thresholds. To avoid undesired comparator faults, two internal DACs set the separate overvoltage (COMP_OV) and undervoltage (COMP_UV) thresholds. The DACs use the REF2 (4.5 V) reference, which is a separate circuit from the 2.5 V (VREF) ADC reference. The OV threshold can range from 2 V to 5.175 V in steps of 25 mV. The UV threshold can range from 0.7 V to 3.875 V in steps of 25 mV. NOTE When the cell voltage is very close to the comparator thresholds, enabling or disabling cell balancing may result in transient comparator faults. Use the DEVCONFIG[COMP_CONFIG] register to enable OV and UV faults, OV-only faults, or no faults. Enabling UV-only faults is not possible. NOTE If the comparators are disabled then re-enabled during normal operation (such as after startup has occurred), the OV faults are signaled and must be manually cleared. 7.3.12.8.1 Window Comparator Special Considerations As shown in Figure 24, there are resistors of approximately 100 Ω in series with each VSENSE pin that isolate the connections to the AFE from the secondary-protector circuits (window comparators). This isolator allows detection of common-cause failures affecting both the AFE and secondary-protector circuits. A Squeeze function in the device helps to detect open-sense wire (to the monitored cell) conditions. When the Squeeze function turns on, it places an approximately 5-kΩ resistance across adjacent VSENSE inputs, and creates an additional voltage drop through the approximately 100- Ω series resistors. This causes the apparent increase in the voltage applied to the window-comparator blocks immediately above, and below, the inputs that have the Squeeze resistor applied. Only the comparators can see the increased voltage not the AFE. This in turn may cause the OV comparator fault to trip, even if the external sense-pin voltage measurement says otherwise, depending on the OV threshold. |
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