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BQ76PL455APFCT Datasheet(PDF) 102 Page - Texas Instruments

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Part # BQ76PL455APFCT
Description  16-Cell Industrial Integrated Battery Monitor
PDF  125 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

BQ76PL455APFCT Datasheet(HTML) 102 Page - Texas Instruments

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102
bq76PL455A
SLUSCL0A – SEPTEMBER 2016 – REVISED OCTOBER 2016
www.ti.com
Product Folder Links: bq76PL455A
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Copyright © 2016, Texas Instruments Incorporated
Application Information (continued)
8.1.2.2.7
Isolation Capacitor
The differential signal lines are isolated between ICs by a DC blocking capacitor. The capacitor must be rated
with a high enough voltage to provide standoff margin in the event of a fault in the system that exposes the
device to a local hazardous voltage. Selecting a capacitor rated at a minimum of 2 times the stack the voltage is
the recommended practice. One capacitor is sufficient for the normal operation of the device. However, two
capacitors are used (one at each end of the cable or PCB wiring) for an additional safety factor. In these
applications, the capacitor must be doubled from the typical requirement to maintain the required capacitance in
the signal path. Connect a minimum of 1 nF, with ±10% or better tolerance and the appropriate voltage rating for
the application. In noisy environments, 2 nF is recommended.
8.1.2.2.8
Unused Differential Communications Pins
Unused stack communications pins (COMMH+/–, COMML+/–, FAULTH+/–, FAULTL+/–) have internal
terminations; no external pull-up or pull-down resistors are required on these pins, if not used. If not used, leave
the unused pins unconnected. The COMMH drivers cannot be disabled.
8.1.3 ADC
8.1.3.1 Idle (Parking) Channel Errors
Between acquisition cycles, the multiplexer idles on the highest VSENSE channel enabled for conversion by the
CHANNELS register for sampling first on the next cycle.
Parking introduces a very small error to the idle channel due to the input impedance of the device causing a
small IR drop through the external resistor, which is part of the LP filter. The error is increased when using
VSENSE series resistors greater than 100
Ω. Setting the AFE_CTL bit = 1 in this application provides the
greatest error improvement. When AFE_PCTL is set, every time cell voltage sampling requests occur, cell
voltage sampling delays by 100 µs, regardless of the power status of the AFE. This maintains sampling
synchronization between multiple chips. Changes to this bit do not take effect until after the next AFE sample
occurs.
8.1.3.2 VSENSE Channel Post-Assembly Calibration Adjustment
Use of post-assembly calibration adjustment can improve device accuracy further after exposure to soldering
and/or bake cycles in the manufacturing process. ADC gain and offset-correction factors are programmable in
the bq76PL455A to allow for post-assembly calibration. The total range of adjustment limitation for both factors is
from –9.77 mV to 9.69 mV.
Application of these gain and offset corrections is global to all VSENSE channels. The AUX channels do not
receive these corrections. Application of the corrections is to the raw ADC values after application of the factory-
stored offset and gain corrections.
Perform the correction procedures at room temperature (RT) using a stable, high-accuracy DC source and / or
voltmeter. The registers contain signed 2's complement values. A zero value in either register indicates no
correction. Measurement of two voltage points, VIN1 and VIN2, occurs for each correction. The expected
minimum and maximum values for the cell can be used; however, ensure the lowest VINMIN value is greater than
or equal to 2.0 V and the highest VINMAXis less than or equal to 4.5 V.
For best results in most designs, both VIN1 and VIN2 use the average voltage measured by each channel
VSENSE1–16 after correcting for any errors in the stimulus (source) voltages at each input.
8.1.3.2.1
Gain Error Correction
Gain Error Correction: –9.77 mV to 9.69 mV in 255 steps (8 bits) in register VSGAIN
Procedure:
1. Apply voltage VIN1, read back from ADC VOUT1, and record both.
2. Apply voltage VIN2, read back from ADC VOUT2, and record both.
3. Calculate slope m = (VOUT2–VOUT1) / (VIN2–VIN1).
4. Find the gain error correction (GEC) at 5 V in 16-bit LSB (5 V is used regardless of VINx value).



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